Error tolerant memory system
Current DRAM chips can ensure error-free data storage (except for radiation-induced soft errors), which largely simplifies the overall computing system design. Each DRAM cell contains one transistor and one capacitor. Unfortunately, it becomes increasingly challenging to maintain the sufficiently large capacitance (hence error-free data storage). It has become clear that STT-RAM has the true potential to complement or even replace DRAM as the main memory in computing systems. However, STT-RAM cannot achieve comparable bit cost as DRAM.