Terahertz Plasmonics for Testing Very Large-Scale Integrated Circuits under Bias

Researchers at Rensselaer Polytechnic Institute have developed a technology which could improve VLSI testing by allowing for non-destructive testing of VLSI circuits under bias for electronic systems. With this new technology, researchers have focused on improving testing output as chip density increases along with decreasing chip sizes. Terahertz radiation (and related radiation at other frequencies – RF, sub-THz) is used to illuminate the chip under the test.